一、分割成多个stil文件进行仿真
1.write_patterns …/data/atpg/KaTeX parse error: Expected group after '_' at position 14: {design_name}_?{atpg_mode}_${ldo_mode}_seri_f.stil
-replace -format stil -serial -internal -split 1000
通过增加-split可以分裂成多个stil文件，例如原本为2900个pattern，会分割为3个stil文件。
二、set_atpg
1.set_atpg -coverage max_percent
Specifies a test coverage limit at which to terminate the ATPG effort. The value may be any decimal number between 0 and 100. Note: Basic-Scan ATPG is performed in groups of 32 patterns and this can result in the final test coverage being slightly higher than the level requested with the -coverage option.
指定终止ATPG工作的测试覆盖率限制。取值可以是0到100之间的任何十进制数。注意:Basic-Scan ATPG是在32个模式组中执行的，这可能导致最终的测试覆盖率略高于使用-coverage选项请求的级别。
2.set_atpg -patterns max_patterns
Specifies termination of the ATPG effort when the pattern count equals or exceeds the selected value. A value of 0 disables this limit. The default is no pattern limit.
指定当模式计数等于或超过选定值时终止ATPG工作。值0将禁用此限制。默认是没有模式限制。
3.set_atpg -chain_test <off | 0011 | 0101 | 1000 | 0111 | string>
Generates a chain test as pattern 0 during ATPG. The choices are:
off - Do not generate pattern.
0011 - (Default) Generate a repeating pattern of 0011…
0101 - Generate a repeating pattern of 01…
1000 - Generate a pattern of 0’s lead by a 1 (that is, 10000…000)
0111 - Generate a pattern of 1’s lead by a 0 (that is, 01111…111)
string - Generate a user-defined sequence of 1’s and 0’s having a final character of “C” to repeat the last digit as a constant or “R” to repeat sequence For example:
011001R --> 011001 011001 011001
011011C --> 011011 111111 111111
在ATPG期间生成一个模式0的链测试。的选择是:
off -不生成图案。
0011 -(默认)生成一个重复的0011模式…
0101 -生成重复模式01…
1000 -生成一个由1引导的0的模式(即10000…000)
0111 -生成一个由0引导的1的模式(即01111…111)
string—生成一个用户定义的1和0的序列，序列的最后一个字符为“C”，以重复最后一个数字为常数，或者以“R”重复序列。例如:
011001r—> 011001 011001 011001
011011c—> 011011 111111 111111
三、set_faults
1.set_faults -fault_coverage | -nofault_coverage
Indicates whether the fault summary reports the fault coverage. The default is not to report this information. The calculation of the fault coverage is affected by the inclusion or exclusion of faults for unused gates. By default, unused gates and their associated faults are removed from the design during flattening to extend gate capacity. If you want an accurate fault coverage report, you can have TetraMAX ATPG retain the unused gates during the circuit flattening process. This is controlled with the -nodelete_unused_gates option of the set_build command.
显示故障汇总是否报告故障范围。默认情况下不报告此信息。故障覆盖范围的计算受到未使用门电路故障的包含或排除的影响。默认情况下，在扁平化过程中，未使用的门及其相关故障被从设计中移除，以扩展门容量。如果你想要一个准确的故障覆盖报告，你可以让TetraMAX ATPG在电路压扁过程中保留未使用的门。这是由set_build命令的-nodelete_unused_gates选项控制的。
2.set_faults -model <stuck | iddq | iddq_bridging | transition | path_delay | hold_time | bridging | dynamic_bridging>
stuck — Generates standard ATPG patterns (the default).
iddq — Uses the IDDQ model to generate patterns to measure IDDQ.
transition — Applies the transition fault model for using last shift or system clock to launch a transition.
stuck——生成标准的ATPG模式(默认)。
iddq——使用iddq模型生成度量iddq的模式。
transition——应用过渡故障模型，使用最后一班或系统时钟启动过渡。
四、缩写
五、插入OCC
set_dft_configuration -clock_controller enable
：解释 -clock_controller enable | disable
Enables or disables the clock controller for on chip clocking
为芯片时钟启用或禁用时钟控制器
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